spacer gif spacer gif spacer gif spacer gif spacer gif
QUICK SEARCH:   [advanced]


spacer gif
     Home     Help     Feedback     Subscriptions     Archive     Search     Table of Contents    

Right arrow Help viewing high resolution images
Right arrow Return to article
(Downloading may take up to 30 seconds.
If the slide opens in your browser, select File -> Save As to save it.)
Click on image to view larger version.



Fig. 1. Characterization of nanostructured surfaces. Scanning electron microscopy image of a cross-sectional view of the silicon structures created by X-ray lithography. p, pitch; g, groove size; r, ridge size; e, etch depth. Scale bar: 400 nm.





Right arrow Return to article